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Dissociative attachment of electrons to $CS_{2}$
| Content Provider | Scilit |
|---|---|
| Author | Krishnakumar, E. Nagesha, K. |
| Copyright Year | 1992 |
| Description | Journal: Journal of Physics B: Atomic, Molecular and Optical Physics The formation of various negative ions from $CS_{2}$ by electron impact up to 50 eV is studied using a crossed beam geometry. A pulsed electron beam-pulsed ion extraction technique has been coupled with a specially designed time-of-flight mass spectrometer to make complete detection of all the ions irrespective of their kinetic energies and mass-to-charge ratios. The cross sections for the formation of different ions are put on an absolute scale using the relative flow technique. The formation of S^{-}$_{2}$ through dissociative attachment is confirmed and is explained as arising from the presence of small number of $CS_{2}$ molecules with bending mode excitations in the neutral molecular beam. From the various thresholds the dissociation energy and electron affinity of CS are determined to be 6.5 and 0.8 eV respectively. |
| Related Links | http://iopscience.iop.org/article/10.1088/0953-4075/25/7/032/pdf |
| Ending Page | 1660 |
| Page Count | 16 |
| Starting Page | 1645 |
| ISSN | 09534075 |
| e-ISSN | 13616455 |
| DOI | 10.1088/0953-4075/25/7/032 |
| Journal | Journal of Physics B: Atomic, Molecular and Optical Physics |
| Issue Number | 7 |
| Volume Number | 25 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1992-04-14 |
| Access Restriction | Open |
| Subject Keyword | Journal: Journal of Physics B: Atomic, Molecular and Optical Physics Atomic, Molecular and Chemical Physics Cross Section Electron Impact Electron Affinity Electron Beam Kinetic Energy |
| Content Type | Text |
| Resource Type | Article |
| Subject | Atomic and Molecular Physics, and Optics Condensed Matter Physics |
