NDLI: Hard x-ray phase imaging using simple propagation of a coherent synchrotron radiation beam

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Hard x-ray phase imaging using simple propagation of a coherent synchrotron radiation beam

Content Provider	Scilit
Author	Cloetens, Peter Ludwig, Wolfgang Baruchel, José Guigay, Jean-Pierre Pernot-Rejmánková, Petra Salomé-Pateyron, Murielle Schlenker, Michel Buffière, Jean-Yves Maire, Eric Peix, Gilles
Copyright Year	1999
Description	Journal: Journal of Physics D: Applied Physics Particularly high coherence of the x-ray beam is associated, on the ID19 beamline at ESRF, with the small angular size of the source as seen from a point of the sample (0.1-1 µrad). This feature makes the imaging of phase objects extremely simple, by using a `propagation' technique. The physical principle involved is Fresnel diffraction. Phase imaging is being simultaneously developed as a technique and used as a tool to investigate light natural or artificial materials introducing phase variations across the transmitted x-ray beam. They include polymers, wood, crystals, alloys, composites or ceramics, exhibiting inclusions, holes, cracks, ... . `Tomographic' three-dimensional reconstruction can be performed with a filtered back-projection algorithm either on the images processed as in attenuation tomography, or on the phase maps retrieved from the images with a reconstruction procedure similar to that used for electron microscopy. The combination of diffraction (`topography') and Fresnel (`phase') imaging leads to new results.
Related Links	http://iopscience.iop.org/article/10.1088/0022-3727/32/10A/330/pdf
Ending Page	A151
Page Count	7
Starting Page	A145
ISSN	00223727
e-ISSN	13616463
DOI	10.1088/0022-3727/32/10a/330
Journal	Journal of Physics D: Applied Physics
Issue Number	10A
Volume Number	32
Language	English
Publisher	IOP Publishing
Publisher Date	1999-01-01
Access Restriction	Open
Subject Keyword	Journal: Journal of Physics D: Applied Physics Filtered Back Projection Electron Microscopy
Content Type	Text
Resource Type	Article
Subject	Surfaces, Coatings and Films Acoustics and Ultrasonics Condensed Matter Physics Electronic, Optical and Magnetic Materials

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