NDLI: A New Method for Axial Decay Function Calibration of Evanescent Field in Multi-Angle Total Internal Reflection Fluorescence Microscopy

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A New Method for Axial Decay Function Calibration of Evanescent Field in Multi-Angle Total Internal Reflection Fluorescence Microscopy

Content Provider	Scilit
Author	Wu, Jian Xiu, Peng Jin, Luhong Nan, Di Kuang, Cuifang Zheng, Xiaoxiang Xu, Yingke Liu, Xu
Copyright Year	2016
Description	Journal: Journal of Physics: Conference Series Three-dimensional image reconstruction in multi-angle total internal reflection fluorescence microscopy relies on actual penetration depths of evanescent wave at various incidence angles. In this paper, we propose a simple and elegant calibration method to calculate the actual axial decay profile of a given evanescent field, for the analytical solution of theoretical equation is hard to solve in complicated conditions. The results calculated by the proposed method agree with the experimental demands in our research. Our calibration method, together with multi-angle TIRF imaging, permits 3D reconstruction of cell surface in superb axial resolution.
Related Links	http://iopscience.iop.org/article/10.1088/1742-6596/680/1/012025/pdf
ISSN	17426588
e-ISSN	17426596
DOI	10.1088/1742-6596/680/1/012025
Journal	Journal of Physics: Conference Series
Issue Number	1
Volume Number	680
Language	English
Publisher	IOP Publishing
Publisher Date	2016-01-01
Access Restriction	Open
Subject Keyword	Journal: Journal of Physics: Conference Series 3d Reconstruction Fluorescence Microscopy Total Internal Reflection Reflection Fluorescence
Content Type	Text
Resource Type	Article
Subject	Physics and Astronomy

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