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Conductive, magnetic and structural properties of multilayer films
| Content Provider | Scilit |
|---|---|
| Author | Kotov, L. N. Turkov, V. K. Vlasov, V. S. Lasek, M. P. Kalinin, Yu E. Sitnikov, A. V. |
| Copyright Year | 2013 |
| Description | Journal: Iop Conference Series: Materials Science and Engineering Composite-semiconductor and composite-dielectric multilayer films were obtained by the ion beam sputtering method in the argon and hydrogen atmospheres with compositions: {[(Co45-Fe45-Zr10)x(Al2O3)y]-[α-Si]}120, {[(Co45-Ta45-Nb10)x(SiO2)y]-[SiO2]}56, {[(Co45-Fe45-Zr10)x(Al2O3)y]-[α-Si:H]}120. The images of surface relief and distribution of the dc current on composite layer surface were obtained with using of atomic force microscopy (AFM). The dependencies of specific electric resistance, ferromagnetic resonance (FMR) fields and width of line on metal (magnetic) phase concentration x and nanolayers thickness of multilayer films were obtained. The characteristics of FMR depend on magnetic interaction among magnetic granules in the composite layers and between the layers. These characteristics depend on the thickness of composite and dielectric or semiconductor nanolayers. The dependences of electric microwave losses on the x and alternating field frequency were investigated. |
| Related Links | http://iopscience.iop.org/article/10.1088/1757-899X/47/1/012027/pdf http://iopscience.iop.org/1757-899X/47/1/012027/pdf/1757-899X_47_1_012027.pdf |
| ISSN | 17578981 |
| e-ISSN | 1757899X |
| DOI | 10.1088/1757-899x/47/1/012027 |
| Journal | Iop Conference Series: Materials Science and Engineering |
| Volume Number | 47 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2013-12-13 |
| Access Restriction | Open |
| Subject Keyword | Journal: Iop Conference Series: Materials Science and Engineering Condensed Matter Physics Composite Layer Multilayer Films Composite Dielectric Fe45 Zr10 |
| Content Type | Text |
| Resource Type | Article |