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Latch up effect under electromagnetic pulse
| Content Provider | Scilit |
|---|---|
| Author | Shurenkov, V. V. Gromov, Dmitry |
| Copyright Year | 2016 |
| Description | Journal: Iop Conference Series: Materials Science and Engineering The physics of CMOS Latch-Up (latchup) under high power microwave radiation is discussed. |
| Related Links | http://iopscience.iop.org/article/10.1088/1757-899X/151/1/012012/pdf |
| ISSN | 17578981 |
| e-ISSN | 1757899X |
| DOI | 10.1088/1757-899x/151/1/012012 |
| Journal | Iop Conference Series: Materials Science and Engineering |
| Issue Number | 1 |
| Volume Number | 151 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2016-10-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Iop Conference Series: Materials Science and Engineering Condensed Matter Physics Electromagnetic Pulse Power Microwave High Power Effect Under Electromagnetic |
| Content Type | Text |
| Resource Type | Article |