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International round robin test of the retained critical current after double bending at room temperature of Ag-sheathed Bi-2223 superconducting wires
| Content Provider | Scilit |
|---|---|
| Author | Yamada, Y. Nishijima, G. Osamura, K. Shin, H. S. Goldacker, W. Breschi, M. Ribani, P. |
| Copyright Year | 2015 |
| Description | Journal: Superconductor Science and Technology An international round robin test was carried out in order to establish a test method for retained critical current after double bending at room temperature of Ag-sheathed Bi-2223 superconducting wires. Tests for commercial Bi-2223 tape were conducted by six laboratories using the same guidelines. The standard uncertainties (SUs) of measurands were evaluated for these four quantities: I$ _{C0}$, I$ _{C}$/I$ _{C080}$, I$ _{C}$/I$ _{C060}$, I$ _{C}$/I$ _{C050}$, where, I$ _{C0}$ is initial critical current and I$ _{C}$ /I$ _{C0XX }$ is critical current after XX mm bending. Using an F test to determine where the most scatter was generated in the test results it was found that the greatest scatter in the normalized critical current measurements came from inter-laboratory scatter. In a type-B uncertainty evaluation, the major contribution was from the bending diameter and measuring temperature. The relative SU tended to increase as the bending diameter decreased. A specific mandrel diameter corresponding to a retained critical current of 95% could be determined with a relative SU of 1.3%. In order to reduce the overall scatter, the temperature difference between the critical current measurements before and after bending should be small. |
| Related Links | http://iopscience.iop.org/article/10.1088/0953-2048/29/2/025010/pdf |
| ISSN | 09532048 |
| e-ISSN | 13616668 |
| DOI | 10.1088/0953-2048/29/2/025010 |
| Journal | Superconductor Science and Technology |
| Issue Number | 2 |
| Volume Number | 29 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2015-12-21 |
| Access Restriction | Open |
| Subject Keyword | Journal: Superconductor Science and Technology |
| Content Type | Text |
| Resource Type | Article |
| Subject | Ceramics and Composites Materials Chemistry Metals and Alloys Condensed Matter Physics Electrical and Electronic Engineering |
