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Subsurface defect characterization and laser-induced damage performance of fused silica optics polished with colloidal silica and ceria
| Content Provider | Scilit |
|---|---|
| Author | He, Xiang Wang, Gang Zhao, Heng Ma, Ping |
| Copyright Year | 2016 |
| Description | Journal: Chinese Physics B This paper mainly focuses on the influence of colloidal silica polishing on the damage performance of fused silica optics. In this paper, nanometer sized colloidal silica and micron sized ceria are used to polish fused silica optics. The colloidal silica polished samples and ceria polished samples exhibit that the root-mean-squared (RMS) average surface roughness values are 0.7 nm and 1.0 nm, respectively. The subsurface defects and damage performance of the polished optics are analyzed and discussed. It is revealed that colloidal silica polishing will introduce much fewer absorptive contaminant elements and subsurface damages especially no trailing indentation fracture. The 355-nm laser damage test reveals that each of the fused silica samples polished with colloidal silica has a much higher damage threshold and lower damage density than ceria polished samples. Colloidal silica polishing is potential in manufacturing high power laser optics. |
| Related Links | http://iopscience.iop.org/article/10.1088/1674-1056/25/4/048104/pdf |
| ISSN | 16741056 |
| e-ISSN | 20583834 |
| DOI | 10.1088/1674-1056/25/4/048104 |
| Journal | Chinese Physics B |
| Issue Number | 4 |
| Volume Number | 25 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 2016-04-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Chinese Physics B Surface Roughness Fused Silica Colloidal Silica Polishing Polished with Colloidal |
| Content Type | Text |
| Resource Type | Article |
| Subject | Physics and Astronomy |
