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Thin-film chemical sensors with waveguide Zeeman interferometry
| Content Provider | Scilit |
|---|---|
| Author | Äyräs, P. Honkanen, S. Grace, K. M. Shrouf, K. Katila, P. Leppihalme, M. Tervonen, A. Yang, X. Swanson, B. Peyghambarian, N. |
| Copyright Year | 1998 |
| Description | Journal: Pure and Applied Optics: Journal of the European Optical Society Part A We describe a highly sensitive chemical sensor scheme using a channel waveguide with a selective surface coating based on polarimetric Zeeman interferometry. The sensing is based on measurement of the phase difference between TE and TM modes propagating in the anisotropic waveguide structure under exposure to toluene vapour. A real-time and reversible response at low ppm level is observed. Modelling results of the sensor structure to further increase its sensitivity are presented. |
| Related Links | http://iopscience.iop.org/article/10.1088/0963-9659/7/6/006/pdf |
| Ending Page | 1271 |
| Page Count | 11 |
| Starting Page | 1261 |
| ISSN | 09639659 |
| e-ISSN | 13616617 |
| DOI | 10.1088/0963-9659/7/6/006 |
| Journal | Pure and Applied Optics: Journal of the European Optical Society Part A |
| Issue Number | 6 |
| Volume Number | 7 |
| Language | English |
| Publisher | IOP Publishing |
| Publisher Date | 1998-11-01 |
| Access Restriction | Open |
| Subject Keyword | Journal: Pure and Applied Optics: Journal of the European Optical Society Part A |
| Content Type | Text |
| Resource Type | Article |
| Subject | Physics and Astronomy Engineering |