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TEM observations of silicon deformed under an hydrostatic pressure
| Content Provider | Scilit |
|---|---|
| Author | Demenet, J. L. Rabier, J. Garem, H. |
| Copyright Year | 2021 |
| Description | The microstructure of silicon plastically deformed at low temperature under an hydrostatic pressure has been studied by TEM as a function of strain. Deformation occurs by perfect dislocations for a compression axis. Hexagonal silicon platelets have been also observed and characterized in a sample deformed at 700°C. |
| Related Links | https://content.taylorfrancis.com/books/download?dac=C2006-0-04292-6&isbn=9781003069621&format=googlePreviewPdf |
| Ending Page | 360 |
| Page Count | 6 |
| Starting Page | 355 |
| DOI | 10.1201/9781003069621-57 |
| Language | English |
| Publisher | Informa UK Limited |
| Publisher Date | 2021-01-29 |
| Access Restriction | Open |
| Subject Keyword | Book Name: Microscopy of Semiconducting Materials, 1987 Metallurgy and Metallurgical Engineering Function Silicon Compression Dislocations Hydrostatic Pressure Hexagonal Perfect Plastically |
| Content Type | Text |
| Resource Type | Chapter |