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Cross-sectional STM on InGaAs/InAIAs laser structures
| Content Provider | Scilit |
|---|---|
| Author | Offermans, P. Koenraad, Pm Wolter, J. H. Song, J. D. Kim, J. M. Bae, S. J. Lee, Y. T. Beck, M. Aellen, T. Faist, J. |
| Copyright Year | 2018 |
| Description | Book Name: Microscopy of Semiconducting Materials 2003 |
| Related Links | https://content.taylorfrancis.com/books/download?dac=C2017-0-66874-9&isbn=9781351074636&doi=10.1201/9781351074636-148&format=pdf |
| Ending Page | 656 |
| Page Count | 4 |
| Starting Page | 653 |
| DOI | 10.1201/9781351074636-148 |
| Language | English |
| Publisher | Informa UK Limited |
| Publisher Date | 2018-01-10 |
| Access Restriction | Open |
| Subject Keyword | Book Name: Microscopy of Semiconducting Materials 2003 Atmospheric Sciences |
| Content Type | Text |
| Resource Type | Chapter |