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Design of adigitally controlled adhesion imaging mode using a scanning force microscope
| Content Provider | Scilit |
|---|---|
| Author | Drelich, J. Mittal, Kash L. |
| Copyright Year | 2005 |
| Description | Various modes of scanning force microscopy (SFM) have been used in studies of surfaces and interfaces since the conception of S F M in the early 1980s [1-4]. An increasing number of SFM-based studies are being devoted to biological systems and biomaterials [5-12]. The spatially resolved information about materials surface energetics, topography, and mechanical properties such as compliance is available from local S F M force-displacement measurements (often referred to as 'force curves'), i.e. from the local force interaction profiles between the SFM probe and a small area of the specimen [13]. The S F M technique can be used to correlate the spatial distribution of these material properties with the material's biocompatibility, which ultimately depends on an intricate combination of surface energetics, topography, and mechanical properties. Book Name: Atomic Force Microscopy in Adhesion Studies |
| Related Links | https://content.taylorfrancis.com/books/download?dac=C2012-0-01935-9&isbn=9780429087295&doi=10.1201/b12164-116&format=pdf |
| Ending Page | 623 |
| Page Count | 5 |
| Starting Page | 619 |
| DOI | 10.1201/b12164-116 |
| Language | English |
| Publisher | Informa UK Limited |
| Publisher Date | 2005-10-01 |
| Access Restriction | Open |
| Subject Keyword | Book Name: Atomic Force Microscopy in Adhesion Studies Microscopic Research Mechanical Properties Topography Sfm Scanning Force Used Surface Energetics Intricate Combination |
| Content Type | Text |
| Resource Type | Chapter |
