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Interaction between Ferroelectric Polarization and Defects in BiFeO3 Thin Films
| Content Provider | Scilit |
|---|---|
| Author | Li, Lin-Ze Xie, Lin Zhang, Yi Cheng, Xiaoxing Hong, Zijian Adamo, Carolina Heikes, Colin Schlom, Darrell Chen, Long-Qing Pan, Xiao-Qing |
| Copyright Year | 2017 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/4D1322AC3B80F17F22F5881445E52825/S1431927617008686a.pdf/div-class-title-interaction-between-ferroelectric-polarization-and-defects-in-bifeo-span-class-sub-3-span-thin-films-div.pdf |
| Ending Page | 1605 |
| Page Count | 2 |
| Starting Page | 1604 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927617008686 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S1 |
| Volume Number | 23 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2017-07-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |