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Experimental and Simulation Methods in Scanning Electron Nanobeam Diffraction
| Content Provider | Scilit |
|---|---|
| Author | Ophus, Colin Bustillo, Karen Pekin, Thomas C. Pryor, Aj Miao, Jianwei Shevitski, Brian Aloni, Shaul Ercius, Peter Ciston, Jim Minor, Andrew M. |
| Copyright Year | 2018 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/E51295C87924E803EB21BD8231E75BDB/S1431927618012084a.pdf/div-class-title-experimental-and-simulation-methods-in-scanning-electron-nanobeam-diffraction-div.pdf |
| Ending Page | 2321 |
| Page Count | 2 |
| Starting Page | 2320 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927618012084 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S1 |
| Volume Number | 24 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2018-08-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |