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Advances in Defocused-Beam Analysis and Compositional Mapping with the Electron-Probe Microanalyzer
| Content Provider | Scilit |
|---|---|
| Author | Carpenter, P. Zeigler, R. Jolliff, B. |
| Copyright Year | 2010 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/17F5FF18B2DE2D192C5A0D1E7D73058B/S1431927610054255a.pdf/div-class-title-advances-in-defocused-beam-analysis-and-compositional-mapping-with-the-electron-probe-microanalyzer-div.pdf |
| Ending Page | 895 |
| Page Count | 2 |
| Starting Page | 894 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927610054255 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S2 |
| Volume Number | 16 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2010-07-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Analysis and Compositional |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |