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Quantitative Electron Probe Microanalysis of Fe at Low Accelerating Voltage Using the Lα and Lβ X-ray Lines
| Content Provider | Scilit |
|---|---|
| Author | Moy, Aurélien Fournelle, John |
| Copyright Year | 2017 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/E9233C6AFE9F7896856AFD821F35E64F/S1431927617005955a.pdf/div-class-title-quantitative-electron-probe-microanalysis-of-fe-at-low-accelerating-voltage-using-the-l-and-l-x-ray-lines-div.pdf |
| Ending Page | 1059 |
| Page Count | 2 |
| Starting Page | 1058 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927617005955 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S1 |
| Volume Number | 23 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2017-07-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Nuclear Energy and Engineering |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |