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2-D Mapping of Ferroelectric Domains by Transmission Electron Microscopy
| Content Provider | Scilit |
|---|---|
| Author | Pan, X. Nelson, C. Zhang, Y. Kim, S. Winchester, B. Chen, L. Melville, A. Adamo, C. Schlom, D. Folkman, C. Baek, S. Eom, C. |
| Copyright Year | 2011 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/77FAABCE5BB5026B243B901A7507F780/S1431927611007653a.pdf/div-class-title-2-d-mapping-of-ferroelectric-domains-by-transmission-electron-microscopy-div.pdf |
| Ending Page | 1357 |
| Page Count | 2 |
| Starting Page | 1356 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927611007653 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S2 |
| Volume Number | 17 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2011-07-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Mathematical Social Sciences Ferroelectric Domains Transmission Electron Extended Abstract Microscopy Extended Electron Microscopy |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |