NDLI: Analysis of GaAs Compound Semiconductors and the Semiconductor Laser Diode using Off-Axis Electron Holography, Lorentz Microscopy, Electron Diffraction Microscopy and Differential Phase Contrast STEM

Content Provider	Scilit
Author	Sasaki, Hirokazu Otomo, Shinya Minato, Ryuichiro Yamamoto, Kazuo Hirayama, Tsukasa Yamasaki, Jun Shibata, Naoya
Copyright Year	2015
Related Links	https://www.cambridge.org/core/services/aop-cambridge-core/content/view/C70A6CFC0D4A8BA511EB30DEFA3BF689/S143192761501065Xa.pdf/div-class-title-analysis-of-gaas-compound-semiconductors-and-the-semiconductor-laser-diode-using-off-axis-electron-holography-lorentz-microscopy-electron-diffraction-microscopy-and-differential-phase-contrast-stem-div.pdf
Ending Page	1976
Page Count	2
Starting Page	1975
ISSN	14319276
e-ISSN	14358115
DOI	10.1017/s143192761501065x
Journal	Microscopy and Microanalysis
Issue Number	S3
Volume Number	21
Language	English
Publisher	Cambridge University Press (CUP)
Publisher Date	2015-08-01
Access Restriction	Open
Subject Keyword	Microscopy and Microanalysis Atmospheric Sciences
Content Type	Text
Resource Type	Synopsis
Subject	Instrumentation

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Analysis of GaAs Compound Semiconductors and the Semiconductor Laser Diode using Off-Axis Electron Holography, Lorentz Microscopy, Electron Diffraction Microscopy and Differential Phase Contrast STEM