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Three-Dimensional Resolution Limits and Image Contrast Mechanisms in Scanning Confocal Electron Microscopy
| Content Provider | Scilit |
|---|---|
| Author | D'Alfonso, Aj Nellist, Pd Wang, P. Behan, G. Kirkland, Ai Hashimoto, A. Shimojo, M. Mitsuishi, K. Takeguchi, M. Cosgriff, E. Allen, Lj Findlay, Sd |
| Copyright Year | 2010 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/3D9C303BB29122A29A1B965A2D2C23B8/S1431927610057533a.pdf/div-class-title-three-dimensional-resolution-limits-and-image-contrast-mechanisms-in-scanning-confocal-electron-microscopy-div.pdf |
| Ending Page | 1835 |
| Page Count | 2 |
| Starting Page | 1834 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927610057533 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S2 |
| Volume Number | 16 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2010-07-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Dimensional Resolution Limits |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |