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Atomic-Resolution EELS in Aberration-Corrected STEM
| Content Provider | Scilit |
|---|---|
| Author | Findlay, S. D. Oxley, M. P. Allen, L. J. Lupini, A. R. Pennycook, S. J. |
| Copyright Year | 2003 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/68CEA95163E14BF28498862C9C82A945/S1431927603444267a.pdf/div-class-title-atomic-resolution-eels-in-aberration-corrected-stem-div.pdf |
| Ending Page | 853 |
| Page Count | 2 |
| Starting Page | 852 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927603444267 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S02 |
| Volume Number | 9 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2003-07-24 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Atmospheric Sciences |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |