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Focused Ion Beam Prepared Cross-Sectional Transmission Electron Microscopy Preparation On CaGe2 On Ge(111) Grown By Molecular Beam Epitaxy
| Content Provider | Scilit |
|---|---|
| Author | Williams, Robert E. A. Xu, Jinsong Hanks, Amanda Ahmed, Adam Pinchuk, Igor V. McComb, Dave Kawakami, Roland Katoch, Jyoti |
| Copyright Year | 2017 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/A2A6EBC6A0AD8632C60691D89746ADC1/S1431927617002136a.pdf/div-class-title-focused-ion-beam-prepared-cross-sectional-transmission-electron-microscopy-preparation-on-cage2-on-ge-111-grown-by-molecular-beam-epitaxy-div.pdf |
| Ending Page | 291 |
| Page Count | 2 |
| Starting Page | 290 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927617002136 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S1 |
| Volume Number | 23 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2017-07-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |