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What is the Best Beam Energy for X-Ray Microanalysis of Nanomaterials in Electron Microscopy?
| Content Provider | Scilit |
|---|---|
| Author | Gauvin, R. Michaud, P. Trudeau, Ml |
| Copyright Year | 2009 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/5C5EA144920EF6788E016115546091BD/S1431927609092587a.pdf/div-class-title-what-is-the-best-beam-energy-for-x-ray-microanalysis-of-nanomaterials-in-electron-microscopy-div.pdf |
| Ending Page | 461 |
| Page Count | 2 |
| Starting Page | 460 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927609092587 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S2 |
| Volume Number | 15 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2009-04-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Extended Abstract Ray Microanalysis Electron Microscopy |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |