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Impurity Segregation via Extended Defects in Oxide Thin Films Probed by Aberration-Corrected STEM-EELS
| Content Provider | Scilit |
|---|---|
| Author | Baek, David J. Lu, Di Hikita, Yasuyuki Hwang, Harold Y. Kourkoutis, Lena F. |
| Copyright Year | 2016 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/1768DE2D0D38D0E6D5863C835C7CED4B/S1431927616008436a.pdf/div-class-title-impurity-segregation-via-extended-defects-in-oxide-thin-films-probed-by-aberration-corrected-stem-eels-div.pdf |
| Ending Page | 1519 |
| Page Count | 2 |
| Starting Page | 1518 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/S1431927616008436 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S3 |
| Volume Number | 22 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2016-02-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |