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The Scanning Confocal Electron Microscope
| Content Provider | Scilit |
|---|---|
| Author | Zaluzec, Nestor J. |
| Copyright Year | 2003 |
| Description | Imaging of sub-micron , sub-surface features of thick optically dense materials at high resolution has always been a difficult and/or time consuming task in materials research. For the most part this role has been relegated to technologically complex and expensive instrumentation having highly penetrating radiation, such as the synchrotron- based Scanning Transmission X-ray Microscope (STXM) or involves the careful preparation of thin cross-section slices for study using the Transmission/Scanning Transmission Electron Microscope (TEM/STEM). |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/80134890B47CACCB3B1E4E3B31464078/S1551929500053384a.pdf/div-class-title-the-scanning-confocal-electron-microscope-div.pdf |
| ISSN | 15519295 |
| e-ISSN | 21503583 |
| DOI | 10.1017/s1551929500053384 |
| Journal | Microscopy Today |
| Issue Number | 6 |
| Volume Number | 11 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2003-12-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy Today Microscopic Research |
| Content Type | Text |
| Resource Type | Article |