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Microstructural Characterization of a Thermal Barrier Coating System Using SEM, TEM and APT Techniques
| Content Provider | Scilit |
|---|---|
| Author | Chen, Y. Reed, R. C. Marquis, E. A. |
| Copyright Year | 2013 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/B966BF073D8A36CA1C1A4C98321F4679/S143192761301132Xa.pdf/div-class-title-microstructural-characterization-of-a-thermal-barrier-coating-system-using-sem-tem-and-apt-techniques-div.pdf |
| Ending Page | 1867 |
| Page Count | 2 |
| Starting Page | 1866 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s143192761301132x |
| Journal | Microscopy and Microanalysis |
| Issue Number | S2 |
| Volume Number | 19 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2013-08-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |