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Development of TEM-SXES instruments for valence electron spectroscopy
| Content Provider | Scilit |
|---|---|
| Author | Terauchi, M. |
| Copyright Year | 2009 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/3028E48991EFA4180478D28552BB6D7F/S1431927609096081a.pdf/div-class-title-development-of-tem-sxes-instruments-for-valence-electron-spectroscopy-div.pdf |
| Ending Page | 215 |
| Page Count | 2 |
| Starting Page | 214 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927609096081 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S2 |
| Volume Number | 15 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2009-04-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Electron Spectroscopy Extended Abstract Spectroscopy Extended |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |