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Temperature Measurement in a TEM using Electron Diffraction of Amorphous Films
| Content Provider | Scilit |
|---|---|
| Author | Hayashida, Misa Cui, Kai Malac, Marek |
| Copyright Year | 2017 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/BC52D1838293EA6AB7F430E5B8686F8E/S1431927617005414a.pdf/div-class-title-temperature-measurement-in-a-tem-using-electron-diffraction-of-amorphous-films-div.pdf |
| Ending Page | 951 |
| Page Count | 2 |
| Starting Page | 950 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927617005414 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S1 |
| Volume Number | 23 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2017-07-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Temperature Measurement Films Peer Tem Using Yesnrc Publication Electron Diffraction |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |