NDLI: More than One Ever Wanted to Know about X-Ray Detectors Part VI: Alternate Semiconductors for Detectors

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More than One Ever Wanted to Know about X-Ray Detectors Part VI: Alternate Semiconductors for Detectors

Content Provider	Scilit
Author	Lund, Mark W.
Copyright Year	1995
Description	X-ray spectrometers give the capability to determine chemical element composition in electron microscopes. The semiconductor with the most experience as an x-ray detector is silicon. Silicon is the most highly developed material on earth, and has a lot of good things going for it, but for some applications we crave something with other good properties. For example, for room temperature detectors it would be best to have a semiconductor with a wider band gap. For higher resolution it would be better to have a semiconductor with a smaller band gap. For these reasons a number of other semiconductors have been developed as x-ray detectors. In this article I will talk about narrow band gap semiconductors. Next time I will discuss large band gap semiconductors.
Related Links	https://www.cambridge.org/core/services/aop-cambridge-core/content/view/34E8BEB3CC06E127E9336CD54D30F404/S1551929500066116a.pdf/div-class-title-more-than-one-ever-wanted-to-know-about-x-ray-detectors-part-vi-alternate-semiconductors-for-detectors-div.pdf
Ending Page	13
Page Count	2
Starting Page	12
ISSN	15519295
e-ISSN	21503583
DOI	10.1017/s1551929500066116
Journal	Microscopy Today
Issue Number	5
Volume Number	3
Language	English
Publisher	Cambridge University Press (CUP)
Publisher Date	1995-06-01
Access Restriction	Open
Subject Keyword	Microscopy Today Nuclear Energy and Engineering
Content Type	Text
Resource Type	Article

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