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Correlative Atomic Force and Transmission Electron Microscopy toward Applications of Atomic Force Microscopy to Heterogeneous Systems
| Content Provider | Scilit |
|---|---|
| Author | Yamada, Yutaro Haruyama, Takamitsu Shimabukuro, Katsuya Konno, Hiroki |
| Copyright Year | 2016 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/3D304535D5698C25AA74BD00E3BD3198/S1431927616012241a.pdf/div-class-title-correlative-atomic-force-and-transmission-electron-microscopy-toward-applications-of-atomic-force-microscopy-to-heterogeneous-systems-div.pdf |
| Ending Page | 45 |
| Page Count | 2 |
| Starting Page | 44 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927616012241 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S5 |
| Volume Number | 22 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2016-02-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Analytical Chemistry |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |