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Focused Ion Beam Sample Preparation of Complex Devices
| Content Provider | Scilit |
|---|---|
| Author | Russell, P. E. Bunker, K. L. Garcia, R. Stark, T. J. Vitarelli, J. P. |
| Copyright Year | 2005 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/CF129E8DA03609017B75E97E5F7E28BC/S1431927605501284a.pdf/div-class-title-focused-ion-beam-sample-preparation-of-complex-devices-div.pdf |
| Ending Page | 89 |
| Page Count | 2 |
| Starting Page | 88 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927605501284 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S02 |
| Volume Number | 11 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2005-08-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Analytical Chemistry Ion Beam Sample Preparation Beam Sample Focused Ion Extended Abstract Complex Devices Devices Extended |
| Content Type | Text |
| Resource Type | Article |
| Subject | Instrumentation |