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Optical, Structural and Interface Characterization of Single SiO2-SiC Core-Shell Nanowires Grown with a Low-Cost Method
| Content Provider | Scilit |
|---|---|
| Author | Fabbri, F. Rossi, F. Attolini, G. Salviati, G. Iannotta, S. Aversa, L. Verucchi, R. Nardi, M. Fukata, N. Dierre, B. Sekiguchi, T. |
| Copyright Year | 2010 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/595A6AA989D1A61054E99C64CC91CE59/S1431927610059829a.pdf/div-class-title-optical-structural-and-interface-characterization-of-single-sio-span-class-sub-2-span-sic-core-shell-nanowires-grown-with-a-low-cost-method-div.pdf |
| Ending Page | 827 |
| Page Count | 2 |
| Starting Page | 826 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927610059829 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S2 |
| Volume Number | 16 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2010-07-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |