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Atom Probe Tomography Characterization of Engineered Oxide Multilayered Structures
| Content Provider | Scilit |
|---|---|
| Author | Nandasiri, M. I. Madaan, N. Devaraj, A. Bao, J. Xu, Z. Varga, T. Shutthanandan, V. Thevuthasan, S. |
| Copyright Year | 2015 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/D1BED6DA4D365B21C9521D34DD2B3061/S1431927615005024a.pdf/div-class-title-atom-probe-tomography-characterization-of-engineered-oxide-multilayered-structures-div.pdf |
| Ending Page | 846 |
| Page Count | 2 |
| Starting Page | 845 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/S1431927615005024 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S3 |
| Volume Number | 21 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2015-08-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |