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In Situ TEM Characterization of Electrochemical Systems
| Content Provider | Scilit |
|---|---|
| Author | Noh, K. Sun, L. Chen, X. Wen, J. Dillon, S. |
| Copyright Year | 2011 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/DA3C8F1188A760D0C209B16B4C374C77/S1431927611008737a.pdf/div-class-title-in-situ-tem-characterization-of-electrochemical-systems-div.pdf |
| Ending Page | 1573 |
| Page Count | 2 |
| Starting Page | 1572 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927611008737 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S2 |
| Volume Number | 17 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2011-07-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Education Research Situ Tem Characterization Characterization of Electrochemical Extended Abstract |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |