Loading...
Please wait, while we are loading the content...
Similar Documents
“H-Bar Lift-Out” and “Plan-View Lift-Out”: Robust, Re-thinnable FIB-TEM Preparation for Ex-Situ Cross-Sectional and Plan-View FIB Specimen Preparation
| Content Provider | Scilit |
|---|---|
| Author | Patterson, R. J. Mayer, D. Weaver, L. Phaneuf, M. W. |
| Copyright Year | 2002 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/E05E7F0EB5DBD3BD52847836993CD9D1/S1431927602105502a.pdf/div-class-title-h-bar-lift-out-and-plan-view-lift-out-robust-re-thinnable-fib-tem-preparation-for-ex-situ-cross-sectional-and-plan-view-fib-specimen-preparation-div.pdf |
| Ending Page | 567 |
| Page Count | 2 |
| Starting Page | 566 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927602105502 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S02 |
| Volume Number | 8 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2002-08-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |