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FIB TEM Sample Preparation of Deeply Buried Interfaces
| Content Provider | Scilit |
|---|---|
| Author | Rye, M. Michael, J. Yang, N. |
| Copyright Year | 2011 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/E6F09F74542AC00C938F5C51EC4646BD/S1431927611004351a.pdf/div-class-title-fib-tem-sample-preparation-of-deeply-buried-interfaces-div.pdf |
| Ending Page | 697 |
| Page Count | 2 |
| Starting Page | 696 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927611004351 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S2 |
| Volume Number | 17 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2011-02-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Tem Sample Sample Preparation Fib Tem Interfaces Extended Extended Abstract Buried Interfaces Deeply Buried |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |