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Procedure for TEM Measurement of Nanoparticles
| Content Provider | Scilit |
|---|---|
| Author | Stratton, W. G. Buckett, M. I. McKernan, S. |
| Copyright Year | 2013 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/DFE4413F461A29824DD9D0B4FD16BE9C/S1431927613007484a.pdf/div-class-title-procedure-for-tem-measurement-of-nanoparticles-div.pdf |
| Ending Page | 1099 |
| Page Count | 2 |
| Starting Page | 1098 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927613007484 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S2 |
| Volume Number | 19 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2013-08-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Microscopic Research Measurement of Nanoparticles Extended Abstract Nanoparticles Extended |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |