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Internal Temperature Calibration at Nanoscale on in situ Heating High Resolution Transmission Electron Microscopy
| Content Provider | Scilit |
|---|---|
| Author | Lan, Y. Wang, H. Chen, G. Ren, Z. |
| Copyright Year | 2013 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/ED8D3BBF72C4C474CA2B6EF6B66F04A7/S1431927613004480a.pdf/div-class-title-internal-temperature-calibration-at-nanoscale-on-in-situ-heating-high-resolution-transmission-electron-microscopy-div.pdf |
| Ending Page | 499 |
| Page Count | 2 |
| Starting Page | 498 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927613004480 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S2 |
| Volume Number | 19 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2013-08-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Temperature Calibration Calibration At Nanoscale |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |