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Imaging at High Beam Energies in the Scanning Electron Microscope
| Content Provider | Scilit |
|---|---|
| Author | Gignac, L. Boettcher, S. Bol, A. Wells, O. Kawasaki, M. |
| Copyright Year | 2006 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/F090E251D8220589F524F226B1FDA1E4/S1431927606065858a.pdf/div-class-title-imaging-at-high-beam-energies-in-the-scanning-electron-microscope-div.pdf |
| Ending Page | 1445 |
| Page Count | 2 |
| Starting Page | 1444 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927606065858 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S02 |
| Volume Number | 12 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2006-08-01 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Extended Abstract Electron Microscope Microscope Extended |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |