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Interfaces and Extended Structural Defects in Chalcopyrite Thin-Film Solar Cells Studied by Transmission Electron Microscopy
| Content Provider | Scilit |
|---|---|
| Author | Schmidt, S. S. Dietrich, J. Koch, C. T. Schaffer, B. Klingsporn, M. Merdes, S. Abou-Ras, D. |
| Copyright Year | 2014 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/1A89F85E79FAB966E6758C631593B6FF/S1431927614004371a.pdf/div-class-title-interfaces-and-extended-structural-defects-in-chalcopyrite-thin-film-solar-cells-studied-by-transmission-electron-microscopy-div.pdf |
| Ending Page | 531 |
| Page Count | 2 |
| Starting Page | 530 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927614004371 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S3 |
| Volume Number | 20 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2014-08-27 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Inorganic Chemistry |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |