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Development of Cryo-STEM for Scanning Electron Microscopy
| Content Provider | Scilit |
|---|---|
| Author | Dobberstein, H. Duan, H. Skepper, Jn Hayles, M. |
| Copyright Year | 2006 |
| Related Links | https://www.cambridge.org/core/services/aop-cambridge-core/content/view/9671A01CEBEB55A570A55A09B9182D54/S1431927606066499a.pdf/div-class-title-development-of-cryo-stem-for-scanning-electron-microscopy-div.pdf |
| Ending Page | 1117 |
| Page Count | 2 |
| Starting Page | 1116 |
| ISSN | 14319276 |
| e-ISSN | 14358115 |
| DOI | 10.1017/s1431927606066499 |
| Journal | Microscopy and Microanalysis |
| Issue Number | S02 |
| Volume Number | 12 |
| Language | English |
| Publisher | Cambridge University Press (CUP) |
| Publisher Date | 2006-07-31 |
| Access Restriction | Open |
| Subject Keyword | Microscopy and Microanalysis Scanning Electron Microscopy |
| Content Type | Text |
| Resource Type | Synopsis |
| Subject | Instrumentation |