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| Content Provider | Royal Society of Chemistry (RSC) |
|---|---|
| Author | Pomjakushina, E. Leake, S. J. Cancellieri, C. Harrington, G. F. Willmott, P. R. Kilner, J. A. Cavallaro, A. Reinle-Schmitt, M. L. |
| Copyright Year | 2014 |
| Abstract | The properties of single-crystal SrTiO3 substrates and homoepitaxial SrTiO3 films grown by pulsed laser deposition have been compared, in order to understand the loss of interfacial conductivity when more than a critical thickness of nominally homoepitaxial SrTiO3 is inserted between a LaAlO3 film and a SrTiO3 substrate. In particular, the chemical composition and the structure of homoepitaxial SrTiO3 investigated by low-energy ion-scattering and surface X-ray diffraction show that for insulating heterointerfaces, a Sr-excess is present between the LaAlO3 and homoepitaxial SrTiO3. Furthermore, an increase in the out-of-plane lattice constant is observed in LaAlO3, indicating that the conductivity both with and without insertion of the SrTiO3 thin film originates from a Zener breakdown associated with the polar catastrophe. When more than a critical thickness of homoepitaxial SrTiO3 is inserted between LaAlO3 and SrTiO3, the electrons transferred by the electronic reconstruction are trapped by the formation of a Sr-rich secondary phase and Sr-vacancies. The migration of Sr towards the surface of homoepitaxial SrTiO3 and accompanying loss of interfacial conductivity can be delayed by reducing the Sr-content in the PLD target. |
| Starting Page | 2598 |
| Ending Page | 2602 |
| Page Count | 5 |
| File Format | HTM / HTML PDF |
| ISSN | 20403364 |
| Volume Number | 6 |
| Issue Number | 5 |
| Journal | Nanoscale |
| DOI | 10.1039/c3nr06456e |
| Language | English |
| Publisher | Royal Society of Chemistry |
| Access Restriction | Open |
| Subject Keyword | X-ray crystallography Zener effect Lattice constant Lanthanum aluminate Pulsed laser deposition |
| Content Type | Text |
| Resource Type | Article |
| Subject | Nanoscience and Nanotechnology |
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