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The new future of scanning probe microscopy: Combining atomic force microscopy with other surface-sensitive techniques, optical microscopy and fluorescence techniques

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The new future of scanning probe microscopy: Combining atomic force microscopy with other surface-sensitive techniques, optical microscopy and fluorescence techniques

Content Provider	Royal Society of Chemistry (RSC)
Author	Flores, Susana Moreno Toca-Herrera, José L.
Copyright Year	2009
Abstract	Atomic force microscopy (AFM) is in its thirties and has become an invaluable tool for studying the micro- and nanoworlds. As a stand-alone, high-resolution imaging technique and force transducer, it defies most other surface instrumentation in ease of use, sensitivity and versatility. Still, the technique has limitations to overcome. A promising way is to integrate the atomic force microscope into hybrid devices, a combination of two or three complementary techniques in one instrument. In this way, a comprehensive description of molecular processes is at hand; morphological, (electro)chemical, mechanical and kinetic information are simultaneously obtained in one experiment. Hereby we review the recent efforts towards such development, describing the aim and the applications resulting from the combination of AFM with spectroscopic, optical, mechanical or electrochemical techniques. Interesting possibilities include using AFM to bring optical microscopies beyond the diffraction limit and also bestowing spectroscopic capabilities on the atomic force microscope.
Starting Page	40
Ending Page	49
Page Count	10
File Format	HTM / HTML PDF
ISSN	20403364
Volume Number	1
Issue Number	1
Journal	Nanoscale
DOI	10.1039/b9nr00156e
Language	English
Publisher	Royal Society of Chemistry
Access Restriction	Open
Subject Keyword	Atomic-force microscopy Electrochemistry Diffraction-limited system Ultrasonic transducer
Content Type	Text
Resource Type	Article
Subject	Nanoscience and Nanotechnology

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