NDLI: Probing the structure of a water/nitrobenzene interface by scanning ion conductance microscopy

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Probing the structure of a water/nitrobenzene interface by scanning ion conductance microscopy

Content Provider	Royal Society of Chemistry (RSC)
Author	Zhu, Xinyu Liang, Zhongwei Ji, Tianrong Wang, Lingyu Shao, Yuanhua Liu, Shujuan
Copyright Year	2011
Abstract	A new experimental approach to probe the structure of a water/nitrobenzene (W/NB) interface by scanning ion conductance microscopy (SICM) is presented. A nanopipette filled with aqueous solution serves as a SICM tip. The tip current is produced by the transfer of chloride (Cl−) and tetraphenylarsonium (TPAs+) ions between the aqueous solution inside the pipette and outer organic solution. The tip current increases instantaneously as a sign of touching the interface when such a tip approaches the W/NB interface. The continuous change of tip current suggests ion penetrations into the interfacial region which is less than 1 nm, in accordance with the mixed solvent model. Ion distribution information can also be extracted from the current–distance (approach) curves obtained from solutions with a series of electrolyte concentrations. The experimental results show that the SICM approach curves are sensitive to the thickness of diffuse layers. This type of technique is actually a modified version of SICM, and is similar to the operation of ion transfer mode of scanning electrochemical microscopy (SECM) with a SICM instrumentation.
Starting Page	1523
Ending Page	1529
Page Count	7
File Format	HTM / HTML PDF
ISSN	20416520
Volume Number	2
Issue Number	8
Journal	Chemical Science
DOI	10.1039/c1sc00133g
Language	English
Publisher	Royal Society of Chemistry
Access Restriction	Open
Subject Keyword	Scanning electrochemical microscopy Nitrobenzene Chloride Microscopy Electrolyte Ion Solvent Pipette
Content Type	Text
Resource Type	Article
Subject	Chemistry

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