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| Content Provider | PubMed Central |
|---|---|
| Author | Cesare, Giampiero De Augusto, Nascetti Caputo, Domenico |
| Editor | Passaro, Vittorio M. N. |
| Copyright Year | 2015 |
| Abstract | In this work, we propose a multi-parametric sensor able to measure both temperature and radiation intensity, suitable to increase the level of integration and miniaturization in Lab-on-Chip applications. The device is based on amorphous silicon p-doped/intrinsic/n-doped thin film junction. The device is first characterized as radiation and temperature sensor independently. We found a maximum value of responsivity equal to 350 mA/W at 510 nm and temperature sensitivity equal to 3.2 mV/K. We then investigated the effects of the temperature variation on light intensity measurement and of the light intensity variation on the accuracy of the temperature measurement. We found that the temperature variation induces an error lower than 0.55 pW/K in the light intensity measurement at 550 nm when the diode is biased in short circuit condition, while an error below 1 K/µW results in the temperature measurement when a forward bias current higher than 25 µA/cm2 is applied. |
| Related Links | http://dx.doi.org/10.3390/s150612260 |
| Ending Page | 12272 |
| Page Count | 13 |
| Starting Page | 12260 |
| File Format | |
| ISSN | 14248220 |
| e-ISSN | 14248220 |
| Journal | Sensors (Basel, Switzerland) |
| Issue Number | 6 |
| Volume Number | 15 |
| Language | English |
| Publisher | MDPI |
| Publisher Date | 2015-05-01 |
| Access Restriction | Open |
| Rights Holder | MDPI |
| Subject Keyword | Electrical and Electronic Engineering Analytical Chemistry Atomic and Molecular Physics, and Optics Biochemistry Research in Higher Education |
| Content Type | Text |
| Resource Type | Article |
| Subject | Medicine Atomic and Molecular Physics, and Optics Instrumentation Analytical Chemistry Biochemistry Information Systems Electrical and Electronic Engineering |
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