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Improved atomic force microscopy cantilever performance by partial reflective coating
| Content Provider | PubMed Central |
|---|---|
| Author | Schumacher, Zeno Miyahara, Yoichi Laure, Aeschimann Peter, Grütter |
| Editor | Schwarz, Udo D. |
| Copyright Year | 2015 |
| Abstract | Optical beam deflection systems are widely used in cantilever based atomic force microscopy (AFM). Most commercial cantilevers have a reflective metal coating on the detector side to increase the reflectivity in order to achieve a high signal on the photodiode. Although the reflective coating is usually much thinner than the cantilever, it can still significantly contribute to the damping of the cantilever, leading to a lower mechanical quality factor (Q-factor). In dynamic mode operation in high vacuum, a cantilever with a high Q-factor is desired in order to achieve a lower minimal detectable force. The reflective coating can also increase the low-frequency force noise. In contact mode and force spectroscopy, a cantilever with minimal low-frequency force noise is desirable. We present a study on cantilevers with a partial reflective coating on the detector side. For this study, soft (≈0.01 N/m) and stiff (≈28 N/m) rectangular cantilevers were used with a custom partial coating at the tip end of the cantilever. The Q-factor, the detection and the force noise of fully coated, partially coated and uncoated cantilevers are compared and force distance curves are shown. Our results show an improvement in low-frequency force noise and increased Q-factor for the partially coated cantilevers compared to fully coated ones while maintaining the same reflectivity, therefore making it possible to combine the best of both worlds. |
| Related Links | http://dx.doi.org/10.3762/bjnano.6.150 |
| Ending Page | 1456 |
| Page Count | 7 |
| Starting Page | 1450 |
| File Format | |
| ISSN | 21904286 |
| e-ISSN | 21904286 |
| Journal | Beilstein Journal of Nanotechnology |
| Volume Number | 6 |
| Language | English |
| Publisher | Beilstein-Institut |
| Access Restriction | Open |
| Rights Holder | Beilstein-Institut |
| Subject Keyword | Research in Higher Education |
| Content Type | Text |
| Resource Type | Article |
| Subject | Nanoscience and Nanotechnology Physics and Astronomy Electrical and Electronic Engineering |
