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SOME PROBLEMS OF THE DETECTION OF SELF-INTERSTITIAL ATOMS IN FIELD ION MICROSCOPE IMAGES.
| Content Provider | United States Department of Energy Office of Scientific and Technical Information (OSTI.GOV) |
|---|---|
| Author | Robinson, J. T. Wilson, K. L. Seidman, D. N. |
| Organization | Cornell Univ., Ithaca, N. Y. Dept. of Materials Science and Engineering |
| Related Links | https://www.osti.gov/biblio/4605521 |
| Page Count | 26 |
| File Format | |
| DOI | 10.2172/4605521 |
| Language | English |
| Publisher Date | 1972-01-01 |
| Publisher Place | United States |
| Access Restriction | Open |
| Subject Keyword | Physics (Solid State)-Radiation Effects ATOMS CRYSTAL DEFECTS EVAPORATION IMAGES INTERSTITIALS ION BEAMS ION MICROSCOPY KEV RANGE 10-100 MONOCRYSTALS RADIATION EFFECTS TUNGSTEN TUNGSTEN IONS VACANCIES TUNGSTEN IONS/effects on tungsten at 30 and 40 keV, field ion microscopic identification of self-interstitial atoms in TUNGSTEN/ radioinduced defects in high-purity single crystals of, field ion microscopic identification of self-interstitial atoms in tungsten-ion FIELD EMISSION MICROSCOPY/identification of self-interstitial atoms in images of irradiated tungsten |
| Content Type | Text |
| Resource Type | Technical Report |