NDLI: Coupled stress-strain and electrical resistivity measurements on copper based shape memory single crystals

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Coupled stress-strain and electrical resistivity measurements on copper based shape memory single crystals

Content Provider	Open Access Library (OALib)
Author	Morin Michel Araújo Carlos José de Gonzalez Cezar Henrique Quadros Ney Freitas de Guénin Gerard
Abstract	recently, electrical resistivity (er) measurements have been done during some thermomechanical tests in copper based shape memory alloys (sma's). in this work, single crystals of cu-based sma's have been studied at different temperatures to analyse the relationship between stress (s) and er changes as a function of the strain (e). a good consistency between er change values is observed in different experiments: thermal martensitic transformation, stress induced martensitic transformation and stress induced reorientation of martensite variants. during stress induced martensitic transformation (superelastic behaviour) and stress induced reorientation of martensite variants, a linear relationship is obtained between er and strain as well as the absence of hys teresis. in conclusion, the present results show a direct evidence of martensite electrical resistivity anisotropy.
ISSN	15161439
Journal	Materials Research
DOI	10.1590/S1516-14392004000200014
Publisher	ABM, ABC, ABPol, SBCC, SBCr, SBMM, SBPMat
Publisher Date	2004-01-01
Access Restriction	Open
Subject Keyword	Electrical resistivity Martensitic transformation Superelasticity. Shape memory effects
Content Type	Text
Resource Type	Article
Subject	Mechanics of Materials Condensed Matter Physics Materials Science Mechanical Engineering

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