NDLI: Characterization of $Ti/SnO_{2}$ Interface by X-ray Photoelectron Spectroscopy

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Characterization of $Ti/SnO_{2}$ Interface by X-ray Photoelectron Spectroscopy

Content Provider	MDPI
Author	Martinez, Miranda Chourasia, Anil R.
Copyright Year	2022
Description	The $Ti/SnO_{2}$ interface has been investigated in situ via the technique of x-ray photoelectron spectroscopy. Thin films (in the range from 0.3 to 1.1 nm) of titanium were deposited on $SnO_{2}$ substrates via the e-beam technique. The deposition was carried out at two different substrate temperatures, namely room temperature and 200 °C. The photoelectron spectra of tin and titanium in the samples were found to exhibit significant differences upon comparison with the corresponding elemental and the oxide spectra. These changes result from chemical interaction between $SnO_{2}$ and the titanium overlayer at the interface. The $SnO_{2}$ was observed to be reduced to elemental tin while the titanium overlayer was observed to become oxidized. Complete reduction of $SnO_{2}$ to elemental tin did not occur even for the lowest thickness of the titanium overlayer. The interfaces in both the types of the samples were observed to consist of elemental Sn, $SnO_{2}$, elemental titanium, $TiO_{2}$, and Ti-suboxide. The relative percentages of the constituents at the interface have been estimated by curve fitting the spectral data with the corresponding elemental and the oxide spectra. In the 200 °C samples, thermal diffusion of the titanium overlayer was observed. This resulted in the complete oxidation of the titanium overlayer to $TiO_{2}$ upto a thickness of 0.9 nm of the overlayer. Elemental titanium resulting from the unreacted overlayer was observed to be more in the room temperature samples. The room temperature samples showed variation around 20% for the Ti-suboxide while an increasing trend was observed in the 200 °C samples.
Starting Page	202
e-ISSN	20794991
DOI	10.3390/nano12020202
Journal	Nanomaterials
Issue Number	2
Volume Number	12
Language	English
Publisher	MDPI
Publisher Date	2022-01-08
Access Restriction	Open
Subject Keyword	Nanomaterials Spectroscopy Tin Titanium Tin Oxide X-ray Photoelectron Spectroscopy
Content Type	Text
Resource Type	Article

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