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Passive Intermodulation at Contacts of Rough Conductors
| Content Provider | MDPI |
|---|---|
| Author | Dayan, Amir Huang, Yi Schuchinsky, Alex |
| Copyright Year | 2022 |
| Description | Passive intermodulation (PIM) is a niggling phenomenon that debilitates the performance of modern communications and navigation systems. PIM products interfere with information signals and cause their nonlinear distortion. The sources and basic mechanisms of PIM have been studied in the literature but PIM remains a serious problem of signal integrity. In this paper, the main sources and mechanisms of PIM generation by joints of good conductors are discussed. It is shown that the passive electrical, thermal and mechanical nonlinearities are intrinsically linked despite their distinctively different time scales. The roughness of the contact surfaces plays an important role in PIM generation by conductor joints. A review of the PIM phenomenology at the contacts of the good conductors suggests that novel multiphysics models are necessary for the analysis and reliable prediction of PIM products generated by several concurrent nonlinearities of a diverse physical nature. |
| Ending Page | 81 |
| Page Count | 17 |
| Starting Page | 65 |
| e-ISSN | 26733978 |
| DOI | 10.3390/electronicmat3010007 |
| Journal | Electronic Materials |
| Issue Number | 1 |
| Volume Number | 3 |
| Language | English |
| Publisher | MDPI |
| Publisher Date | 2022-02-03 |
| Access Restriction | Open |
| Subject Keyword | Electronic Materials Passive Intermodulation (pim) Nonlinearity Multiphysics Effects Electrical Contacts Surface Roughness Contact Deformation Electro-thermal Effects |
| Content Type | Text |
| Resource Type | Article |
