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Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks
Content Provider | MDPI |
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Author | Adibhatla, Venkat Anil Chih, Huan-Chuang Hsu, Chi-Chang Cheng, Joseph Abbod, Maysam F. Shieh, Jiann-Shing |
Copyright Year | 2020 |
Description | In this study, a deep learning algorithm based on the you-only-look-once (YOLO) approach is proposed for the quality inspection of printed circuit boards (PCBs). The high accuracy and efficiency of deep learning algorithms has resulted in their increased adoption in every field. Similarly, accurate detection of defects in PCBs by using deep learning algorithms, such as convolutional neural networks (CNNs), has garnered considerable attention. In the proposed method, highly skilled quality inspection engineers first use an interface to record and label defective PCBs. The data are then used to train a YOLO/CNN model to detect defects in PCBs. In this study, 11,000 images and a network of 24 convolutional layers and 2 fully connected layers were used. The proposed model achieved a defect detection accuracy of 98.79% in PCBs with a batch size of 32. |
Starting Page | 1547 |
e-ISSN | 20799292 |
DOI | 10.3390/electronics9091547 |
Journal | Electronics |
Issue Number | 9 |
Volume Number | 9 |
Language | English |
Publisher | MDPI |
Publisher Date | 2020-09-22 |
Access Restriction | Open |
Subject Keyword | Electronics Industrial Engineering Convolution Neural Network Yolo Deep Learning Printed Circuit Board |
Content Type | Text |
Resource Type | Article |