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Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head
| Content Provider | MDPI |
|---|---|
| Author | Otieno, Luke Oduor Alunda, Bernard Ouma Kim, Jaehyun Lee, Yong Joong |
| Copyright Year | 2021 |
| Description | A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest component determines the overall bandwidth of the instrument. In this work, we present a design of a compact HS-AFM scan-head featuring minimal loading on the Z-scanner. Using a custom-programmed controller and a high-speed lateral scanner, we demonstrate its working by obtaining topographic images of Blu-ray disk data tracks in contact- and tapping-modes. Images acquired using a contact-mode cantilever with a natural frequency of 60 kHz in constant deflection mode show good tracking of topography at 400 Hz. In constant height mode, tracking of topography is demonstrated at rates up to 1.9 kHz for the scan size of |
| Starting Page | 362 |
| e-ISSN | 14248220 |
| DOI | 10.3390/s21020362 |
| Journal | Sensors |
| Issue Number | 2 |
| Volume Number | 21 |
| Language | English |
| Publisher | MDPI |
| Publisher Date | 2021-01-07 |
| Access Restriction | Open |
| Subject Keyword | Sensors Imaging Science Atomic Force Microscopy High-speed Atomic Force Microscope High-speed Atomic Force Microscope Scan-head |
| Content Type | Text |
| Resource Type | Article |
